Pulsed-magnetron-sputtered low-temperature indium tin oxide films for flat-panel display applications |
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Authors: | William J. Lee Yean-Kuen Fang Jyh-Jier Ho Chin-Ying Chen Rung-Ywan Tsai Daoyang Huang Fang C. Ho H. W. Chou C. C. Chen |
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Affiliation: | (1) VLSI Technical Lab., Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan, 70100, Republic of China;(2) Department of Electronics Engineering, Fortune Institute of Technology, Chi-shan Town, Kaohsiung, Taiwan, 84200, Republic of China;(3) Opto-Electronics & Systems Lab., Industrial Technical Research Institute, Q100, 195-8 Chung Hsing Rd., Section 4, Chutung, Taiwan, 31015, Republic of China;(4) Department of Physics, National Cheng Kung University, Tainan, Taiwan, 70100, Republic of China |
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Abstract: | In this paper, indium tin oxide (ITO) thin films were prepared by unipolar and bipolar direct current (DC)-pulsed magnetron
sputtering in a mixture of argon and oxygen onto unheated glass substrates. The target of ITO with 10 wt.% tin is used. The
influences of polar modes (unipolar and bipolar); output frequencies (0 to 33 kHz); and times and off times on the optical,
electrical, and structural properties of ITO films are investigated. The correlations between the deposition parameters and
the film properties are discussed. It is found that the resistivity with 10−3 Θ-cm and transmittance with ≥90% of amorphous ITO films can be prepared by the reactive bipolar DC-pulsed sputtering with
t
on
−
between 45 μs and 85 μs (i.e., t
on
−
/t
on
+
is 9–17), and t
on
+
, t
off
−
and t
off
+
are constant at 5 μs, 10 μs, and 5 μs, respectively. An optimal condition, based on the polar mode and frequency of reactive-pulsed
sputtering, for obtaining the high transmittance and low resistivity of ITO films is suggested. |
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Keywords: | Indium tin oxide DC-pulsed magnetron sputtering electrical and optical properties |
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