Measurement of particle size and shape by FBRM and in situ microscopy |
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Authors: | Michel Kempkes |
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Affiliation: | ETH Zurich, Institute of Process Engineering, Sonneggstrasse 3, CH-8092 Zurich, Switzerland |
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Abstract: | In this work a model is defined allowing for a rapid calculation of chord length distributions as well as the prediction of in situ microscopy data. Both calculations are done using the same underlying algorithm. The model assumes convex polyhedral particles that are defined by their vertices only, connected by straight lines, but imposes no further restrictions on particle geometry. Due to its speed, the model can easily be used for the prediction of experimental data from in situ monitoring tools based on whole particle populations, also with non-constant shape. The model has been verified using in situ microscopy to characterize a population of disc shaped particles.The applications of the model are focused on crystallization processes, but are not limited to these. Several relations between data measured by in situ instruments and the underlying multidimensional particle size distribution have been derived. The model is used extensively in a method that is presented allowing for the calculation of bidimensional growth rates from Focused Beam Reflectance Measurement or in situ microscopy measurements. |
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Keywords: | Crystallization In situ monitoring Instrumentation Mathematical modeling Particle shape Particulate processes |
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