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Highly sensitive molecular detection with swift heavy ions
Authors:Yoshinobu Wakamatsu  Hideaki YamadaSatoshi Ninomiya  Brian N JonesToshio Seki  Takaaki Aoki  Roger WebbJiro Matsuo
Affiliation:a Department of Nuclear Engineering, Kyoto University, Sakyo, Kyoto 606-8501, Japan
b Quantum Science and Engineering Center, Kyoto University, Uji, Kyoto 611-0011, Japan
c Department of Electronic Science and Engineering, Kyoto University, Nishikyo, Kyoto 615-8510, Japan
d Japan Science and Technology Agency (JST), Chiyoda, Kyoto 102-0075, Japan
e Ion Beam Centre, University of Surrey, Surrey GU2 7XH, UK
Abstract:Various imaging techniques using microbeam have been applied in biology. Secondary ion mass spectrometry (SIMS) is one of the prominent tools for biological imaging; SIMS can provide data on molecular distribution in biological samples smaller than 1 μm. However, conventional SIMS has only low sensitivity for molecular ions; therefore there is a need for beams of more sensitive primary ions. Plasma desorption mass spectrometry (PDMS) is a method using high energy fission fragments from excitation of a 252Cf source, and it allows ionization of large molecules (typically up to 20 kDa) due to the dense electronic excitation. Although PDMS is not in use today because of the development of soft ionization methods, ionization induced by high energy ion collision still remains the only method which combines high spatial resolution and sensitive detection of large molecules. In this work, the secondary ion yield of amino acid and phospholipid was measured for 6 MeV Cu4+. The yields were compared to bismuth cluster ions, which achieve relatively high yield. It was confirmed that the swift heavy ion has a couple of hundred times higher yield for large molecules than bismuth cluster ions.
Keywords:SIMS  Secondary ion emission  Swift heavy ion  Electronic sputtering  Biomolecules
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