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Assessing Impurities in Triple-Point-of-Water Cells Using a Capacitance Conductivity Test |
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| Authors: | X. K. Yan D. R. White X. M. Hao Z. J. Yu H. Edgar Y. N. Duan |
| Affiliation: | 1. National Institute of Metrology (NIM), Beijing, 100013, China 2. Measurement Standards Laboratory, Lower Hutt, 5040, New Zealand 3. University of Science and Technology Beijing, Beijing, 100083, China 4. Chengdu University of Technology, Chengdu, 610059, China |
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| 本文献已被 SpringerLink 等数据库收录！ | |