Investigations of surface characterization of silicone rubber due to tracking phenomena under a.c. and d.c. voltages |
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| Authors: | Uma Maheswar Rao S S M S Abdul Majeed C Venkataseshaiah R Sarathi |
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| Affiliation: | (1) Department of Electrical Engineering, Indian Institute of Technology, 600 036 Chennai, India;(2) Department of Polymer Technology, Crescent Engineering College, 600 048 Chennai, India |
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| Abstract: | In the present work, tracking phenomena has been studied with silicone rubber material under the a.c. and d.c. voltages following
IEC-587 standards. The surface condition of the tracked zone was analysed using wide angle X-ray diffraction (WAXD) and thermogravimetric
differential thermal analysis (TG-DTA) studies. The tracking time was different for a.c. and d.c. voltages. |
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| Keywords: | Silicone rubber surface degradation tracking WAXD TG-DTA |
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