| 磁控管雷基图快速自动测绘技术 |
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| 引用本文： | 魏义学,张兆镗.磁控管雷基图快速自动测绘技术[J].真空电子技术,1998(1):28-32. |
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| 作者姓名： | 魏义学 张兆镗 |
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| 作者单位： | 北京真空电子技术研究所，电子科技大学 |
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| 摘 要： | 本文讨论微波磁控管负载特性曲线即雷基图的快速自动测绘技术。文中提出一种全新的测试原理与方案来实现微波负载阻抗的自动扫描，同时采用了预先设置功率门和频率门的方法实时采集测试数据，使这些数据在等值线生成过程中的利用率达到百分之百，整个测试时间小于８ｍｉｎ。
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| 关 键 词： | 雷基图，磁控管，自动测绘 |
Technology of Fast Automatic Measurement forPlotting Rieke Diagram of Magnetron |
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| Wei Yixue.Technology of Fast Automatic Measurement forPlotting Rieke Diagram of Magnetron[J].Vacuum Electronics,1998(1):28-32. |
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| Authors: | Wei Yixue |
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| Abstract: | A fast automatic measurment method of Rieke diagram that shows the output character of a magnetron is put forward in this paper. One advanced testing principle and idea were presented to scan the impedance of Smith chart with in VSWR = 5. During the scanning course ,data are sampled by one set of frequency and power gates ,and all used to plot Rieke dia- gram. So the measurement system can take less than 8 minutes to plot the Rieke diagram. |
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| Keywords: | Rieke diagram Magnetron Automatic measurement |
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