| 多线阵CCD拼接检测宽幅PS版表面缺陷的研究 |
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| 引用本文： | 王勤,王庆有,齐龙.多线阵CCD拼接检测宽幅PS版表面缺陷的研究[J].光电子．激光,2005,16(11):1350-1354. |
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| 作者姓名： | 王勤 王庆有 齐龙 |
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| 作者单位： | 天津大学精密仪器与光电子工程学院,教育部光电信息技术科学重点实验室,天津,300072;天津大学精密仪器与光电子工程学院,教育部光电信息技术科学重点实验室,天津,300072;天津大学精密仪器与光电子工程学院,教育部光电信息技术科学重点实验室,天津,300072 |
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| 摘 要： | 提出采用多线阵CCD拼接对宽幅PS版表面缺陷进行检测的方法.用多个线阵CCD对宽幅面PS版表面进行分段成像,利用同步驱动使多个CCD并行工作,通过PCI高速数据采集系统将图像送入计算机,再通过图像处理算法进行缺陷检测,检测幅面宽度为1.2 m,分辨率为0.1 mm,检测速度为10 m/min.
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| 关 键 词： | 宽幅面PS版 多线阵CCD拼接 同步驱动 并行数据采集 在线检测 |
| 文章编号： | 1005-0086（2005）11-1350-05 |
| 收稿时间： | 2005-03-09 |
| 修稿时间： | 2005-03-09 |
Study on Inspection of Wide PS Plates Quality Based on Linear CCD Assembling Technique |
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| WANG Qin,WANG Qing-you,QI Long.Study on Inspection of Wide PS Plates Quality Based on Linear CCD Assembling Technique[J].Journal of Optoelectronics·laser,2005,16(11):1350-1354. |
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| Authors: | WANG Qin WANG Qing-you QI Long |
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| Affiliation: | College of Precision Instruments and Opto-electronics Engineering, Tianjin University, Key Laboratory of Opto-electronics Information and Technical Science, EMC,Tianjin 300072, China |
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| Abstract: | A novel wide PS plates quality inspection scheme was developed with multi-optical imaging systems linear COD assembling technique. This method can overcome the shortcoming of the conventional linear OOD assembling methods, extend the measuring range of COD and make the system adjust more conveniently. PS plates surface is dived into several segments and imaged on several COD sensor. These COD sensors are driven synchronously and parallel in order to collect data in high speed of 10 m/min. The measurable width of this system reaches 1.2 m,and the resolution can be up to 0.1 mm. |
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| Keywords: | wide PS plates multi-linear CCD assembling technique synchronous drive high-speed online inspection quality inspection |
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