Characterization and compensation of OLED aging in a digital AMOLED system

Organic light‐emitting diode (OLED) aging is the root cause for image sticking artifact and considered as the toughest problem besides the low yield problem of active‐matrix organic light‐emitting diode (AMOLED) displays. Digital driving can eliminate Mura artifact and allow a similar yield like LCD. However, it is more prone to OLED aging than analog driving, so that the lifetime will become shorter. In this paper, we pursue the approach to measure the pixel current and compensate OLED I–V drift. Information gained from electrical measurements during the lifetime of the display may be correlated to electro‐optical drift, particularly the current efficiency. The aging model has to consider the dependence of I–V drift and efficiency loss on the operation point/voltage for each subframe. Specific compensation algorithms have been developed. Two AMOLED prototypes (1.5 and 2.8 in.) were validated. Burned‐in pattern can be compensated, so the concept has been proven as effective. With the method described in this paper, digital AMOLED may reach a similar and even significantly higher lifetime than an analog AMOLED.