| RFID标签专用测试系统的校准 |
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| 引用本文： | 邢荣欣.RFID标签专用测试系统的校准[J].电子测量技术,2011,34(3):102-106. |
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| 作者姓名： | 邢荣欣 |
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| 作者单位： | 中国电子技术标准化研究所计量与检测中心; |
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| 摘 要： | 目前,我国对RFID标签的应用非常广泛.然而,对于RFID测试设备/读卡器还没有成熟的校准方法,这不利于RFID标签的质量控制.以典型RFID测试系统MP300TCL1为例,介绍了RFID测试系统的校准方法,并对测量不确定度进行了分析.
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| 关 键 词： | RFID测试系统 校准 测量不确定度 |
RFID tag tester calibration |
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| Xing Rongxin.RFID tag tester calibration[J].Electronic Measurement Technology,2011,34(3):102-106. |
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| Authors: | Xing Rongxin |
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| Affiliation: | Xing Rongxin (Calibration and Test Center of China Electronic Standardization Institute,Beijing 100176) |
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| Abstract: | RFID tags are widely used in China.However,there's no published calibration method for RFID testing equipments/card readers.This is a threat to the quality of RFID tags.Presents a calibration process for MP300TCL1,one of typical RFID testing equipment.Measurement uncertainties are also laid out. |
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| Keywords: | RFID tester calibration measurement uncertainty |
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