In-plane contributions to phase contrast in intermittent contact atomic force microscopy |
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Authors: | Marcus Matthew S Eriksson M A Sasaki Darryl Y Carpick Robert W |
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Affiliation: | Physics Department, University of Wisconsin-Madison, Madison, WI, USA. |
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Abstract: | Contrast in the phase response of intermittent-contact atomic force microscopy (IC-AFM) reveals in-plane structural and mechanical properties of polymer monolayers. This result is unexpected, as IC-AFM has previously only been considered as a probe of out-of-plane properties. Until now, AFM measurements of nanoscale in-plane properties have employed contact mode techniques. In-plane property measurements are possible with intermittent contact AFM because there is a small but significant component of tip motion parallel to the sample surface. This in-plane component of tip displacement is virtually universal in AFM, implying that oscillating-tip techniques generally are sensitive to in-plane material properties. We present a simple Hertzian model of intermittent-contact AFM that includes such an in-plane displacement. |
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