Improvements in planar feature reconstructions in atom probe tomography |
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Authors: | Larson D J Geiser B P Prosa T J Gerstl S S A Reinhard D A Kelly T F |
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Affiliation: | Cameca Instruments Inc., Madison, WI, USA. david.larson@ametek.com |
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Abstract: | ![]() Standard atom probe tomography spatial reconstruction techniques have been reasonably successful in reproducing single crystal datasets. However, artefacts persist in the reconstructions that can be attributed to the incorrect assumption of a spherical evaporation surface. Using simulated and experimental field evaporation, we examine the expected shape of the evaporating surface and propose the use of a variable point projection position to mitigate to some degree these reconstruction artefacts. We show initial results from an implementation of a variable projection position, illustrating the effect on simulated and experimental data, while still maintaining a spherical projection surface. Specimen shapes during evaporation of model structures with interfaces between regions of low- and high-evaporation-field material are presented. Use of two-and three-dimensional projection-point maps in the reconstruction of more complicated datasets is discussed. |
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Keywords: | Atom probe microscopy data analysis reconstruction |
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