Observation of a sub-surface defect in sapphire by Rayleigh wave reflection in the scanning acoustic microscope |
| |
Authors: | G. C. Smith M. G. Gee |
| |
Affiliation: | (1) Division of Materials Applications, National Physical Laboratory, Teddington, Middlesex, UK |
| |
Abstract: | |
| |
Keywords: | |
本文献已被 SpringerLink 等数据库收录! |
|