首页 | 本学科首页   官方微博 | 高级检索  
     


Electrochemical growth and characterization of iron doped cadmium sulfide thin films
Affiliation:1. Centre for Scientific and Applied Research, School of Basic Engineering and Sciences, PSN College of Engineering and Technology, Tirunelveli 627152, Tamil Nadu, India;2. Department of Electrical and Computer Engineering, Ajou University, Suwon 443 749, Republic of Korea;3. Department of Physics, Kalasalingam University, Krishnankoil 626 126, Tamil Nadu, India;4. Centro de Investigacion y de Estudios Avanzados del IPN (CINVESTAV), Av. Instituto Politecnico Nacional 2508, Col. San Pedro Zacatenco 07360, Mexico D.F., Mexico;1. Grupo de Espectroscopia de Materiales Avanzados y Nanoestructurados (GEMANA), Centro de Investigaciones en Óptica, A.P. 1-948, León, Guanajuato 37150 Mexico;2. Facultad de Ciencias Físico-Matemáticas, Universidad Autónoma de Coahuila, Saltillo, Coahuila 25280, Mexico;3. Centro de Física Aplicada y Tecnología Avanzada, Universidad Nacional Autónoma de México, A.P. 1-1010, Querétaro 76000, Mexico;4. Instituto Mexicano del Petróleo, Lázaro Cárdenas 152, Col. Atepehuacan, México D.F. C.P. 07730, Mexico;1. Coordinación para la Innovación y Aplicación de la Ciencia y la Tecnología, Universidad Autónoma de San Luis Potosí, Sierra Leona No. 530 Col. Lomas 2da. Sección, San Luis Potosí, S.L.P, México;2. Sección de Electrónica del Estado Sólido, Departamento de Ingeniería Eléctrica, Centro de Investigación y de Estudios Avanzados del I.P.N., Av. Instituto Politécnico Nacional 2508, San Pedro Zacatenco, C.P. 07360 México D.F., México;1. Department of Energy Science, Sungkyunkwan University, Suwon 440-746, Korea;2. National Creative Research Initiative, Center for Smart Molecular Memory, Department of Chemistry, Sungkyunkwan University, 2066 Seoburo, Jangan-Gu, Suwon, Gyeonggi-Do 440-746, Korea;3. Department of Electrical Engineering (SEES), CINVESTAV-IPN, Avenida IPN 2508, San Pedro Zacatenco, Mexico D.F., Mexico;1. College of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Republic of Korea;2. Department of Energy Science, Sungkyunkwan University, Suwon 440-746, Republic of Korea;3. Department of Electrical Engineering (SEES), CINVESTAV-IPN, Col. San Pedro Zacatenco, Mexico City 07360, Mexico;4. Department of Electronics and Communication Engineering, Sikkim Manipal Institute of Technology, Sikkim Manipal University, Sikkim 737136, India;1. V. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, pr. Nauky 41, 03028 Kyiv, Ukraine;2. L. Pysarzhevsky Institute of Physical Chemistry, NAS of Ukraine,pr. Nauky 31, 03028 Kyiv, Ukraine;3. Instituto Politécnico Nacional – ESFM, Av. IPN, Ed.9 U.P.A.L.M.,07738 Mexico D.F., Mexico;1. Instituto Politécnico Nacional, Sección de Estudios de Posgrado e Investigación, SEPI – ESIME – IPN, Av. Instituto Politécnico Nacional S/N, Col. Lindavista, México D.F. 07738, Mexico;2. Instituto Politécnico Nacional, SEPI – ESFM – IPN, Av. Instituto Politécnico Nacional S/N, Col. Lindavista, México D.F. 07738, Mexico;3. Instituto Politécnico Nacional, ESIME – IPN, Av. Instituto Politécnico Nacional S/N, Col. Lindavista, México D.F. 07738, Mexico;4. CIICAp Centro de Investigación en Ingeniería y Ciencias Aplicadas, Av. Universidad No. 1001, Col Chamilpa, Cuernavaca, Morelos, México C.P. 62209, Mexico;5. V. Lashkaryov Institute of Semiconductor Physics at NASU, Kiev, Ukraine;6. Instituto Politécnico Nacional, ESIME – Ticomán, México D.F. 07340, Mexico
Abstract:Cadmium Sulfide and Ferrous doped Cadmium Sulfide thin films have been prepared on different substrates using an electrodeposition technique. Linear sweep voltammetric analysis has been carried out to determine deposition potential of the prepared films. X-ray diffraction analysis showed that the prepared films possess polycrystalline nature with hexagonal structure. Surface morphology and film composition have been analyzed using Scanning electron microscopy and Energy dispersive analysis by X-rays. Optical absorption analysis showed that the prepared films are found to exhibit Band gap value in the range between 2.3, 2.8 eV for Cadmium Sulfide and Ferrous doped Cadmium Sulfide.
Keywords:CdS:Fe  Linear Sweep Voltammetry  Microstructural parameters  Refractive index  Stylus Profilometry  Thin Films
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号