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基于图像处理的片式元件缺陷检测算法
引用本文:李峰峰,袁鹏,吴忻生.基于图像处理的片式元件缺陷检测算法[J].计算机测量与控制,2012,20(4):917-920.
作者姓名:李峰峰  袁鹏  吴忻生
作者单位:华南理工大学自动化科学与工程学院,广东广州,510640
摘    要:表面缺陷检测是电子元器件生产过程中的关键步骤,通过分析表面缺陷检测的现状问题,结合片式元件图像的自身特征,提出一种基于改进的自适应阈值canny算子的片式元件缺陷检测算法;该算法把片式元件灰度图像进行区域分割,得到不同值域范围内的灰度区域,利用带有敏感度的自适应双阈值canny算子进行边缘检测;算法实现结果表明,该算法能高效地检测并处理不同缺陷类型的片式元件,并且可以达到工业生产的检测速度。

关 键 词:缺陷检测  canny算子  区域分割

A Defect Inspection Algorithm of Chip Components Based on Image Processing Technology
Li Fengfeng , Yuan Peng , Wu Xinsheng.A Defect Inspection Algorithm of Chip Components Based on Image Processing Technology[J].Computer Measurement & Control,2012,20(4):917-920.
Authors:Li Fengfeng  Yuan Peng  Wu Xinsheng
Affiliation:(College of Automation Science & Engineering,South China University of Technology,Guangzhou 510640,China)
Abstract:Detection of Surface defects is a key step in the production of electronic components,this paper analysed the actuality of surface detection techniques,put forward a new method of chip components surface detection based on a improved self-adaptive threshold canny algorithm,with the features of chip components.The algorithm segment gray image of chip components into gray area within different range and detect edge by using canny algorithm.The results demonstrate that the method not only can detect different kinds of chip components,but also can reach to the speed in industrial production.
Keywords:defect inspection  canny algorithm  area segment
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