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| Structural imaging of β-Si3N4 by spherical aberration-corrected high-resolution transmission electron microscopy | |
| 摘 要： | |
| 收稿时间： | 7 November 2007 |
| 修稿时间： | 18 March 2009 |
| 本文献已被 ScienceDirect 等数据库收录！ | |
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