| Analysis on Additional Crosstalk Caused by Oblique Incident Ray on PIN Detector Array |
| |
| 作者姓名： | CAOJun－kai |
| |
| 作者单位： | ChongqingOptoelectronicsResearchInstitute,Chongqing400060,CHN |
| |
| 摘 要： | The crosstalk caused by oblique incident ray on a PIN detector array is analyzed.An integral expression of crosstalk factor in relation to incident angle and structure parameters is deduced and the correctness of the deduction is tested and verified.
|
| 关 键 词： | 硅光电二极管 检测器阵列 串扰 PIN CCD |
| 收稿时间： | 1999/11/29 |
Analysis on Additional Crosstalk Caused by Oblique Incident Ray on PIN Detector Array |
| |
| CAO Jun-kai.Analysis on Additional Crosstalk Caused by Oblique Incident Ray on PIN Detector Array[J].Semiconductor Photonics and Technology,2000,6(1):29-33. |
| |
| Authors: | CAO Jun-kai |
| |
| Abstract: | The crosstalk caused by oblique incident ray on a PIN detector array is analyzed. An integral expression of crosstalk factor in relation to incident angle and structure parameters is deduced and the correctness of the deduction is tested and verified. |
| |
| Keywords: | Si-photodiode Detector arrays Crosstalk |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
