| 边界扫描测试技术及其应用 |
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| 引用本文： | 胡莲,肖铁军.边界扫描测试技术及其应用[J].微处理机,2004,25(2):35-37,40. |
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| 作者姓名： | 胡莲 肖铁军 |
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| 作者单位： | 江苏大学计算机科学与通信工程学院,镇江,212013 |
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| 摘 要： | 边界扫描技术是一种完整的、标准化的可测性设计方法，它提供了对电路板上元件的功能、互连等进行测试的一种统一方案，极大地提高了系统测试的效率。本文详细介绍了边界扫描测试的原理、结构，讨论了边界扫描测试技术的应用。
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| 关 键 词： | 边界扫描测试 可测性设计 IEEE1149．1标准 集成电路 数字系统 |
| 文章编号： | 1002-2279(2004)02-0035-03 |
Boundary Scan Test Technology and its Applications |
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| HU Lian,XIAO Tie-jun.Boundary Scan Test Technology and its Applications[J].Microprocessors,2004,25(2):35-37,40. |
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| Authors: | HU Lian XIAO Tie-jun |
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| Abstract: | Boundary scan technology is an integrated and standardized method of design for testability. It provides a scheme for the test of component-functionality, board interconnection, which has greatly improved the efficiency of system debugging. The working principle and architecture of BST is introduced in this paper and its applications are discussed. |
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| Keywords: | Boundary scan test Design for testability IEEE 1149 1 standard |
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