| 场发射透射电子显微镜及能谱功能开发 |
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| 引用本文： | 高峰,李智丽,杨维宇.场发射透射电子显微镜及能谱功能开发[J].包钢科技,2014,40(4):42-45. |
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| 作者姓名： | 高峰 李智丽 杨维宇 |
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| 作者单位： | 内蒙古包钢钢联股份有限公司技术中心,内蒙古包头,014010;内蒙古包钢钢联股份有限公司技术中心,内蒙古包头,014010;内蒙古包钢钢联股份有限公司技术中心,内蒙古包头,014010 |
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| 摘 要： | 文章简述了Tecnai G2 F20场发射透射电子显微镜的组成和基本参数,并详细说明了该透射电镜和能谱的功能开发,主要有：TEM＋EDS功能、HTEM功能、STEM＋EDX点、线、面扫描功能、STEM高分辨功能,并举例说明此设备在产品开发中的应用。
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| 关 键 词： | 透射电镜 STEM 析出物 微观分析 |
Function Development of Field Emission Transmission Electron Microscope and Energy Dispersive Spectrometer |
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| GAO Feng,LI Zhi-li,YANG Wei-yu.Function Development of Field Emission Transmission Electron Microscope and Energy Dispersive Spectrometer[J].Science & Technology of Baotou Steel(Group) Corporation,2014,40(4):42-45. |
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| Authors: | GAO Feng LI Zhi-li YANG Wei-yu |
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| Affiliation: | GAO Feng ,LI Zhi - li , YANG Wei - yu ( Technical Center of Steel Union Co. Ltd. of Baotou Steel (Group) Corp. , Baotou 01401 O, Nei Monggol, China) |
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| Abstract: | In the paper,it is briefly described the composition and basic parameters of Tecnai G2 F20 transmission electron microscope（TEM） as well as illustrated the function development of the transmission electron microscope and energy dispersive spectrometer in detail. The main functions include TEM ＋ EDS, HTEM, scan of point,line and plane for STEM ＋ EDX as well as high resolution of STEM. Moreover,its applications in product development are illustrated. |
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| Keywords: | transmission electron microscope （ TEM ） STEM educt microanalysis |
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