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多层陶瓷电容器银电极电镀锡铅失效原因分析
引用本文:史勤刚,庄立波. 多层陶瓷电容器银电极电镀锡铅失效原因分析[J]. 印制电路信息, 2010, 0(12): 53-54,58
作者姓名:史勤刚  庄立波
作者单位:电子科技大学,四川成都610054
摘    要:
针对多层陶瓷电容器在电镀过程电镀锡铅效果差的问题,利用扫描电子显微镜和能谱仪分析了正常和变差样品银层的微观结构,其结果表明:电镀效果差的样品端电极银层表面出现较大面积的缺损,部分内部介质裸露,影响了后期电镀时银层的导电性,导致电镀效果变差。

关 键 词:多层陶瓷电容器  银层  电镀

Failure analysis of tin-lead plating in Ag Electrode of MLCC
SHI Qin-gang,ZHUANG Li-bo. Failure analysis of tin-lead plating in Ag Electrode of MLCC[J]. Printed Circuit Information, 2010, 0(12): 53-54,58
Authors:SHI Qin-gang  ZHUANG Li-bo
Affiliation:SHI Qin-gang, ZHUANG Li-bo
Abstract:
Aimed at the problem of tin-lead plating in multilayer ceramic capacitors devices,the microstructure and components of Silver termination are studied with SEM and EDS,and the failure modes occurred in the outer-electrode are documented.The results show that appear larger defects in the silver electrode layer surface in samples of electroplating effect poor,part inside medium nudity,affecting late plating conductivity,lead electroplating effect worse.
Keywords:MLCC  Silver termination  Electroplating
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