| 应用锎源实验结果预估空间轨道单粒子翻转率 |
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| 引用本文： | 李永宏,贺朝会,周辉. 应用锎源实验结果预估空间轨道单粒子翻转率[J]. 原子能科学技术, 2009, 43(11): 1029-1033. DOI: 10.7538/yzk.2009.43.11.1029 |
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| 作者姓名： | 李永宏 贺朝会 周辉 |
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| 作者单位： | 1.西安交通大学 ;核科学与技术学院，陕西 ;西安710049； ;2.西北核技术研究所，陕西 ;西安710024 |
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| 摘 要： | 在实验研究的基础上，分析了应用锎源实验结果预估空间轨道单粒子翻转率的可行性。以静态存储器的锎源单粒子翻转截面为例，分3种情况预估了该器件在地球同步轨道上的单粒子翻转率。结果表明，若器件的锎源单粒子翻转截面小于10-10 cm2/bit，在地球同步轨道上的单粒子翻转率则应小于10-8d-1•bit-1。
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| 关 键 词： | 锎源 单粒子翻转率 半导体器件 |
Prediction for Single Event Upset Rate in Space Orbits Based on 252Cf Experimental Results |
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| LI Yong-hong,HE Chao-hui,ZHOU Hui. Prediction for Single Event Upset Rate in Space Orbits Based on 252Cf Experimental Results[J]. Atomic Energy Science and Technology, 2009, 43(11): 1029-1033. DOI: 10.7538/yzk.2009.43.11.1029 |
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| Authors: | LI Yong-hong HE Chao-hui ZHOU Hui |
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| Affiliation: | 1.School of Nuclear Science and Technology, Xi’an Jiaotong University, Xi’an 710049, China； ;2.Northwest Institute of Nuclear Technology, Xi’an 710024, China ; |
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| Abstract: | Feasibility of prediction for single event upset rate based on ~(252)Cf experimental results in space orbits was analyzed. Taking static random access memory as an example, its single event upset (SEU) rates in geostationary orbit were predicted under three circumstances based on its ~(252)Cf SEU cross sections. The result shows that SEU rate in geostationary orbit should be smaller than 10~(-8) d~(-1)· bit~(-1), if ~(252)Cf SEU cross section is smaller than 10~(-10) cm~2/bit. |
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| Keywords: | ~(252)Cf source single event upset rate semiconductor device |
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