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快速测试方案在半导体测试中的应用
引用本文:李木子.快速测试方案在半导体测试中的应用[J].半导体技术,2007,32(5):447-450.
作者姓名:李木子
作者单位:天津飞思卡尔半导体(中国)有限公司,天津,300385
摘    要:随着半导体行业的发展,芯片的设计和功能变得越来越复杂,这样也就需要更多的测试项来筛选器件和检测功能.目前有许多方案致力于解决这一问题.本文讨论介绍了一种半导体测试行业中的快速测试方法,阐述了其概念、方案的设置、实现和操作,指出了快速测试方案的优势以及半导体测试行业对其的需求.

关 键 词:快速测试  测试项  快速测试方案
文章编号:1003-353X(2007)05-447-04
修稿时间:2006-10-20

Application of QuickTest Solution in Current Semiconductor Test Industry
LEE Moods.Application of QuickTest Solution in Current Semiconductor Test Industry[J].Semiconductor Technology,2007,32(5):447-450.
Authors:LEE Moods
Affiliation:Tianjin Freescale Semiconductor (China
Abstract:With the development of semiconductor,the design and the function of the chip become complicate dramatically which requires more and more tests to screen out its defects and verify its functionality.A lot of efforts are spent on it to change this situation.The concept of QuickTest in semiconductor test industry and QuickTest solution's setup,implementation and operation were introduced.The advantage of QuickTest solution and the need from semiconductor test were also figured out.
Keywords:QuickTest  test item  QuickTest solution
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