INL and DNL estimation based on noise for ADC test |
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| Authors: | Flores MdGC Negreiros M Carro L Susin AA |
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| Affiliation: | Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil; |
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| Abstract: | This paper presents the linearity characterization of an analog-to-digital converter (ADC). The input signal is noise, which allows low analog area overhead for built-in self-test (BIST). The linearity error estimation is proposed based on the spectral analysis of only the output of the converter. This paper presents the underlying theory and practical results supporting the effectiveness of the proposed method. |
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