| 微波单片集成电路的成品率优化 |
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| 引用本文： | 吴洪江,薛勇健.微波单片集成电路的成品率优化[J].微纳电子技术,1996(2). |
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| 作者姓名： | 吴洪江 薛勇健 |
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| 作者单位： | 电子部第１３研究所 |
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| 摘 要： | 采用建立管芯等效电路模型、灵敏度分析以及统计勘探法对微波单片集成电路进行成品率优化，并编制了软件，加入到ＧａＡｓＩＣＣＡＤ系统中。应用该软件对Ｘ波段低噪声ＭＭＩＣ、超宽带ＭＭＩＣ放大器进行了设计，成品率有较大的提高，电路性能有所改善。
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| 关 键 词： | 微波单片集成电路，灵敏度分析，统计勘探法，成品率优化 |
Yield Optimization of MMIC |
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| Wu Hongjiang,Xue Yongjian.Yield Optimization of MMIC[J].Micronanoelectronic Technology,1996(2). |
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| Authors: | Wu Hongjiang Xue Yongjian |
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| Abstract: | This paper describes a program which uses chip equivalent circuits,sensitivity analysis and statistical exploration approach to improve the yield of MMIC. Some low noise MMIC amplifiers of X band, ultrabroad band have been designed using the program. The yields and the properties of the MMICs have been improved respectively. |
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| Keywords: | MMIC Sensitivity analysis Satistical exploration approach Yield Optimization |
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