应用于电旋转芯片中电场分析的快速解析算法

电旋转技术目前已经成为相对成熟的生物芯片测量技术手段，但是其测量自动程度和测量精度一直是个需要解决的问题。基于许瓦兹-克里斯托（Schwarz-Christoffel Mapping，SCM）映射方法，一种用于电旋转电场分析的快速解析算法被提出。通过该算法的计算结果，电旋转测量的最佳区域被精确地定义。同时，由于该计算方法的精确度较高，而且相对于传统的有限元方法占用更少的计算资源且具有更快的计算速度，可用于电旋转测量数据的实时校正。最后，对该算法计算的结果和有限元方法计算的结果进行比较，两者的数据能够很好地吻合。

Application of fast analytical algorithm in electric field analysis of electrorotation chip

Electrorotation（ROT） is a wide-used biochip technique to measure the dielectric properties of cells,but its automatic measurement and accuracy of the data is not enough yet.Based on Schwarz-Christoffel Mapping（SCM） method,a fast analytical algorithm in electric field analysis of electrorotation chip is presented.Using this method,the best area is precisely defined,in which the measurement error is small enough.Compared with the conventional finite element method,this algorithm has higher accuracy and uses less computing time and space.So it can be used for real-time correction of electrorotation measurement data.Finally,the results calculated with this algorithm are validated by comparison with the finite element method.The comparison of the results is satisfactory.