Problem oriented transmission electron microscopy |
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Authors: | W. M. Stobbs |
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Abstract: | The relative advantages and disadvantages of the variety of transmission electron microscopical techniques which can be applied to materials science problems are argued by the examination of problems from a range of different fields. The further developments which will be needed before the full potential of some of the more modern approaches can be achieved are also discussed, as are the increasing uses of ‘edge-on’ specimen preparation methods. |
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Keywords: | TEM techniques |
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