首页 | 本学科首页   官方微博 | 高级检索  
     

高压断路器断口均压电容器介质损失角增大原因分析及解决措施
引用本文:孙鹏举,吕洪明.高压断路器断口均压电容器介质损失角增大原因分析及解决措施[J].高压电器,2009,45(2).
作者姓名:孙鹏举  吕洪明
作者单位:安徽淮北供电公司,安徽,淮北,235000
摘    要:笔者通过对高压断路器均压电容器均压原理论述以及损耗的产生和tanδ值易于偏大的原因分析,着重介绍了电容介质材料在交流电压作用下的极化损耗和电导损耗,解析了均压电容器在各种场强下tanδ的变化情况,并提出了降低离子杂质体积分数以改善tanδ增大的解决措施。

关 键 词:均压电容器  损耗角正切tanδ  杂质

Analysis of Grading Capacitor tan8 Expansion for High Voltage Circuit Breaker
SUN Peng-ju,LU Hong-ming.Analysis of Grading Capacitor tan8 Expansion for High Voltage Circuit Breaker[J].High Voltage Apparatus,2009,45(2).
Authors:SUN Peng-ju  LU Hong-ming
Affiliation:Huaibei Electric Power Supply Company;Huaibei 235000;China
Abstract:This paper analyzes the principle of a grading capacitor in a high voltage circuit breaker,its losses,and the cause of tanδ expansion,giving emphasis on polarization loss and dielectric loss of the dielectric material under alternate voltage.The variation of a grading capacitor tanδ under different field intensities is also analyzed.In addition,a method to suppress tanδ expansion is suggested by reducing ionic contaminations.
Keywords:grading capacitor  tangent of loss angle  ionic contamination  
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号