| 基于原子力显微的多模式扫描探针显微镜 |
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| 引用本文： | 吴斌,黄致新,王辉,张峰.基于原子力显微的多模式扫描探针显微镜[J].现代仪器,2007,13(1):10-13. |
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| 作者姓名： | 吴斌 黄致新 王辉 张峰 |
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| 作者单位： | 华中师范大学物理科学与技术学院,武汉,430079 |
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| 摘 要： | 扫描探针显微镜是目前世界上分辨率最高的显微镜之一,也是纳米技术研究的主要工具。本文在分析原子力显微镜工作原理的基础上,探讨多模式扫描探针显微镜的相关功能,并对扫描探针显微镜的发展前景进行展望。
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| 关 键 词： | 扫描探针显微镜 原子力显微镜 多模式 |
Discussion of multimode scanning probe microscope based on AFM |
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| Wu Bin,Huang Zhixin,Wang Hui,Zhang Feng.Discussion of multimode scanning probe microscope based on AFM[J].Modern Instruments,2007,13(1):10-13. |
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| Authors: | Wu Bin Huang Zhixin Wang Hui Zhang Feng |
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| Affiliation: | College of Physical Science and Technology, HuaZhong Normal University, Wuhan 430079 |
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| Abstract: | Scanning probe microscope can reach atomic resolution,and it is important for nano-technology.Based on the discussion of the principle of atomic force microscope,the function of multimode scanning probe microscope has been investigated.And the developing prospects of the scanning probe microscope have been stated at last. |
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| Keywords: | Scanning probe microscope Atomic force microscope Multimode |
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