首页 | 本学科首页   官方微博 | 高级检索  
     

垂直多结PPD像素势阱容量与电荷转移研究
引用本文:李天琦,马超龙,杨晓亮,杜斌.垂直多结PPD像素势阱容量与电荷转移研究[J].电子科技,2013,26(10):166-168,172.
作者姓名:李天琦  马超龙  杨晓亮  杜斌
作者单位:(哈尔滨工程大学 信息与通信工程学院,黑龙江 哈尔滨 150001)
摘    要:研究了一种具有垂直多结结构的CMOS图像传感器四管像素结构,通过引入垂直多结结构可扩展感光区的势阱容量,增大耗尽区,提高信号电荷收集效率,特别对于长波长光波的吸收大幅增加。并为减小垂直多结结构的图像拖影现象,在N区水平方向上进行梯度掺杂,消除了电位障,使得信号电荷更易向外传输,从而减小图像拖影现象,并通过SILVACO TCAD软件对该结构进行数值仿真。

关 键 词:CMOS图像传感器  势阱容量  电荷转移  

Full Well Capacity And Charge Transfer Study for PPD Pixel With Vertical Multi-Junction Structure
LI Tianqi , MA Chaolong , YANG Xiaoliang , DU Bin.Full Well Capacity And Charge Transfer Study for PPD Pixel With Vertical Multi-Junction Structure[J].Electronic Science and Technology,2013,26(10):166-168,172.
Authors:LI Tianqi  MA Chaolong  YANG Xiaoliang  DU Bin
Affiliation:(College of Information and Communication Engineering,Harbin Engineering University,Harbin 150001,China)
Abstract:An 4-T CMOS image sensor pixel with vertical multi-junction structure was investigated.By introducing vertical multi-junction structure can extend the full well capacity of the photosensitive area,the depletion region is increased to improve the collection efficiency of signal charge,especially for long wavelength light absorption greatly increased.And,to reduce the image lag of vertical multi-junction structure,a horizontal gradient doping eliminating the potential barrier,thus,the signal charge easier to pass out,reducing image lag.Its performance was verified by simulation with SILVACO TCAD software.
Keywords:CMOS image sensor  full well capacity  charge transfer  
本文献已被 CNKI 万方数据 等数据库收录!
点击此处可从《电子科技》浏览原始摘要信息
点击此处可从《电子科技》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号