| 微电声器件纯音不良的深入剖析 |
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| 引用本文： | 吕为新. 微电声器件纯音不良的深入剖析[J]. 电声技术, 2012, 36(4): 22-24. DOI: 10.3969/j.issn.1002-8684.2012.04.006 |
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| 作者姓名： | 吕为新 |
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| 作者单位： | 浙江新嘉联电子股份有限公司研发中心,浙江嘉兴,314100 |
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| 摘 要： | 主要研究微电声器件阻尼系统的动态性及音膜胶的密封性与纯音不良的辩证关系,并以实例运用共振频率物理法则来论证,得出特殊状态下的阻尼及上音膜的胶水出现的局部断胶对纯音的影响是客观存在的.
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| 关 键 词： | 微电声器件 共振 纯音不良 |
Pure-tone Negative Analysis of Micro-dectroacoustic Devices |
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| LV Weixin. Pure-tone Negative Analysis of Micro-dectroacoustic Devices[J]. Audio Engineering, 2012, 36(4): 22-24. DOI: 10.3969/j.issn.1002-8684.2012.04.006 |
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| Authors: | LV Weixin |
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| Affiliation: | LV Weixin (R＆D Center Zhejiang New Jialian Electronic Co. , Ltd. , Jiaxing Zhejiang 314100, China) |
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| Abstract: | The dynamic of damping system in micro -electro -acoustic devices is studied, and dialectical relationship between sealing of sound membrane adhesive and pure - tone negative is researched. They are demonstrated by using the laws of physics of the resonance frequency. Finally, a conclusion is made that the effect of damping under special condition and glue of up sound membrane off on pure tone exist objectively. |
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| Keywords: | micro - electroacoustic devices resonance pure - tone negative |
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