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最小生成树SVM的模拟电路故障诊断方法
引用本文:宋国明,王厚军,姜书艳,刘红.最小生成树SVM的模拟电路故障诊断方法[J].电子科技大学学报(自然科学版),2012,41(3):412-417.
作者姓名:宋国明  王厚军  姜书艳  刘红
作者单位:1.电子科技大学自动化工程学院 成都 610054;
基金项目:部级科研项目:,国家自然科学基金,中央高校基本科研业务费专项资金
摘    要:提出最小生成树的支持向量机模拟电路故障诊断方法,通过小波分解提取电路故障特征,在特征空间中以故障类的可分性测度为权值构造最小生成树,得到具有聚类属性的故障子类划分,从而优化故障决策树节点的分布。按照最小生成树的结构建立具有较大分类间隔的多分类支持向量机,能够有效地提高模拟电路故障诊断的正确率。该方法简化支持向量机的结构,在实例电路的故障诊断中获得更高的诊断精度和效率,其性能优于常用的支持向量机方法。

关 键 词:故障诊断    最小生成树    可分性测度    支持向量机
收稿时间:2010-07-21

Fault Diagnosis Approach for Analog Circuits Using Minimum Spanning Tree SVM
SONG Guo-ming,WANG Hou-jun,JIANG Shu-yan,LIU Hong.Fault Diagnosis Approach for Analog Circuits Using Minimum Spanning Tree SVM[J].Journal of University of Electronic Science and Technology of China,2012,41(3):412-417.
Authors:SONG Guo-ming  WANG Hou-jun  JIANG Shu-yan  LIU Hong
Affiliation:1.School of Automation Engineering,University of Electronic Science and Technology of China Chengdu 610054;2.Department of Computer Engineering,Chengdu Electromechanical College Chengdu 610031;3.School of Computer Science and Technology,Changchun University of Science and Technology Changchun 130022
Abstract:A fault diagnosis approach for analog circuits based on minimum spanning tree (MST) support vector machine (SVM) is proposed. Fault features of analog circuits are extracted by wavelet analysis method. By taking separability measure of fault classes as weights of edges in feature space, the MST is generated and the sub-class separation for fault groups with clustering property is achieved. The node distribution of fault decision tree is then optimized. Hierarchical multi-class SVMs with large margins are constituted according to the structure of MST, which can effectively improve the fault diagnosis accuracy of analog circuits. The presented approach simplifies the structure of multiclass SVMs. Case study shows that our approach achieves more precision and higher efficiency comparing with other conventional SVM methods in analog circuit fault diagnosis.
Keywords:
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