In/Al掺杂高电阻CdZnTe晶体载流子传输特性研究

To evaluate the charge transport properties of as-grown high resistivity CdZnTe crystals doped with In/Al, the α particle spectroscopic response was measured using an un-collimated 241Am （5.48 MeV） radioactive source at room temperature. The electron mobility lifetime products （μτ）e of the CdZnTe crystals were predicted by fitting plots of photo-peak position versus electrical field strength using the single carrier Hecht equation. A TOF technique was employed to evaluate the electron mobility for CdZnTe crystals. The mobility was obtained by fitting the electron drift velocities as a function of the electrical field strengths, where the drift velocities were achieved by analyzing the rise-time distributions of the voltage pulses formed by a preamplifier. A fabricated CdZnTe planar detector based on a low In concentration doped CdZnTe crystal with （μτ）e = 2.3 × 10？3 cm2/V and μe =1000 cm2/（V·s）, respectively, exhibits an excellent γ-ray spectral resolution of 6.4% （FWHM = 3.8 keV） for an un-collimated 241Am @ 59.54 keV isotope.