首页 | 本学科首页   官方微博 | 高级检索  
     

A New Method to Investigate InGaAsP Single-Photon AvalancheDiodes Using a Digital Sampling Oscilloscope
作者姓名:Liu Wei  Yang Fuhu  Wu Meng
作者单位:中国科学院半导体研究所 超晶格国家重点实验室,北京 100083;中国科学院半导体研究所 超晶格国家重点实验室,北京 100083;中国科学院半导体研究所 超晶格国家重点实验室,北京 100083
基金项目:国家基础研究重大项目基金
摘    要:介绍了由带尾纤的InGaAs/InP雪崩光电二极管建立的近红外单光子探测系统. 使用带宽50GHz 的数字采样示波器,首次直观地展现了门模式(即盖革模式)工作状态下,单光子探测的模式和过程. 并且在波长分别为1310和1550nm的情况下进行了定量研究. 在1550nm,工作温度203K条件下,该探测器达到了暗计数概率2.4E-3每门,量子效率52%, 50kHz的门信号重复频率;在工作温度为238K时,相应参数分别为8.5E-3,43%和200kHz.

关 键 词:InGaAsP单光子雪崩二极管  50GHz数字采样示波器  门模式
文章编号:0253-4177(2006)10-1711-06
收稿时间:03 31 2006 12:00AM
修稿时间:6/2/2006 10:14:44 AM

A New Method to Investigate InGaAsP Single-Photon AvalancheDiodes Using a Digital Sampling Oscilloscope
Liu Wei,Yang Fuhu,Wu Meng.A New Method to Investigate InGaAsP Single-Photon AvalancheDiodes Using a Digital Sampling Oscilloscope[J].Chinese Journal of Semiconductors,2006,27(10):1711-1716.
Authors:Liu Wei  Yang Fuhua and Wu Meng
Affiliation:State Key Laboratory for Superlattices and Microstructures,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China;State Key Laboratory for Superlattices and Microstructures,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China;State Key Laboratory for Superlattices and Microstructures,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China
Abstract:A near-infrared single-photon detection system is established by using pigtailed InGaAs/InP avalanche photodiodes.With a 50GHz digital sampling oscilloscope,the function and process of gated-mode (Geiger-mode) single-photon detection are intuitionally demonstrated for the first time.The performance of the detector as a gated-mode single-photon counter at wavelengths of 1310 and 1550nm is investigated.At the operation temperature of 203K,a quantum efficiency of 52% with a dark count probability per gate of 2.4E-3,and a gate pulse repetition rate of 50kHz are obtained at 1550nm.The corresponding parameters are 43%,8.5E-3,and 200kHz at 238K.
Keywords:InGaAsP single-photon avalanche diode  50GHz digital sampling oscilloscope  gated-mode
本文献已被 CNKI 等数据库收录!
点击此处可从《半导体学报》浏览原始摘要信息
点击此处可从《半导体学报》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号