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A 4.69-W/mm output power density InAlN/GaN HEMT grown on sapphire substrate
Authors:Liu Bo  Feng Zhihong  Zhang Sen  Dun Shaobo  Yin Jiayun  Li Jia  Wang Jingjing  Zhang Xiaowei  Fang Yulong  Cai Shujun Science  Technology on ASIC Laboratory  Hebei Semiconductor Research Institute  Shijiazhuang  China School of Materials Science  Engineering  Harbin Institute of Technology  Harbin  China
Affiliation:Liu Bo1,Feng Zhihong(1),Zhang Sen2,Dun Shaobo1,Yin Jiayun1,Li Jia1,Wang Jingjing1,Zhang Xiaowei1,Fang Yulong1,and Cai Shujun1 1 Science and Technology on ASIC Laboratory,Hebei Semiconductor Research Institute,Shijiazhuang 050051,China 2 School of Materials Science and Engineering,Harbin Institute of Technology,Harbin 150001,China
Abstract:
Keywords:InAlN/GaN  HEMT  output power density  metal-organic chemical vapor deposition  
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