| 一种测试半导体制冷器的瞬态方法 |
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| 引用本文： | 宫昌萌,陈震,吴洲,常国强,钱瑞明,陈云飞.一种测试半导体制冷器的瞬态方法[J].半导体学报,2006,27(5):944-947. |
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| 作者姓名： | 宫昌萌 陈震 吴洲 常国强 钱瑞明 陈云飞 |
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| 作者单位： | 东南大学机械工程系，南京 210096;东南大学机械工程系，南京 210096;东南大学机械工程系，南京 210096;东南大学机械工程系，南京 210096;东南大学机械工程系，南京 210096;东南大学机械工程系，南京 210096;东南大学MEMS教育部重点实验室，南京 210096 |
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| 基金项目： | 国家重点基础研究发展计划(973计划)
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中国科学院资助项目
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江苏省自然科学基金 |
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| 摘 要： | ZT值、最大制冷温差和响应时间是表征半导体制冷器性能的重要参数.文中介绍了一种能同时测量这三个参数的瞬态方法,并讨论了热沉对测试结果的影响.利用一个由恒流脉冲发生器和数据采集卡组成的简单测试系统测得制冷器在小电流下的电阻电压和塞贝克电压,通过这两个电压推导出ZT值、最大制冷温差.这种瞬态方法是非接触式测量,准确度高,可用于薄膜热电器件测试;另外瞬态方法耗时短,可大大缩短半导体制冷器可靠性测试的周期.采用这种方法对4mm×4mm×2.4mm的热电制冷器进行实验,环境温度300K时,测得ZT值为0.39,最大温差58.5K,响应时间20s.
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| 关 键 词： | 半导体热电制冷器 瞬态测试方法 电阻电压 塞贝克电压 可靠性测试 半导体 热电制冷器 瞬态方法 Thermoelectric Testing Method 最大温差 环境温度 实验 周期 器件测试 薄膜 接触式测量 贝克 电阻 小电流 统测 组成 数据采集卡 |
| 文章编号： | 0253-4177(2006)05-0944-04 |
| 收稿时间： | 09 23 2005 12:00AM |
| 修稿时间： | 11 25 2005 12:00AM |
A Transient Method for Testing Thermoelectric Coolers |
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| Gong Changmeng,Chen Zhen,Wu Zhou,Chang Guoqiang,Qian Ruiming and Chen Yunfei.A Transient Method for Testing Thermoelectric Coolers[J].Chinese Journal of Semiconductors,2006,27(5):944-947. |
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| Authors: | Gong Changmeng Chen Zhen Wu Zhou Chang Guoqiang Qian Ruiming and Chen Yunfei |
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| Affiliation: | Department of Mechanical Engineering,Southeast University,Nanjing 210096,China;Department of Mechanical Engineering,Southeast University,Nanjing 210096,China;Department of Mechanical Engineering,Southeast University,Nanjing 210096,China;Department of Mechanical Engineering,Southeast University,Nanjing 210096,China;Department of Mechanical Engineering,Southeast University,Nanjing 210096,China;Department of Mechanical Engineering,Southeast University,Nanjing 210096,China;Key Laboratory of MEMS of the Education Ministry,Southeast University,Nanjing 210096,China |
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| Abstract: | The figure of merit ZT,maximum temperature difference,and response time are important parameters for thermoelectric coolers.A transient method for testing these parameters is introduced,and the effect of the heat sink is also discussed.The resistance and Seebeck voltages used to calculate the ZT and the maximum temperature difference are measured using a testing system composed of a DC pulse generator and a DAQ card.The transient method is simple and accurate,and can be used to test thin film thermoelectric coolers.In addition,this method spends very little time.Thus,it can shorten the reliability test period for thermoelectric coolers.A 4mm×4mm×2.4mm commercial thermoelectric cooler is tested using this method.A figure of merit ZT of 0.39,maximum temperature difference of 58.5K,and response time of 20s is measured. |
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| Keywords: | thermoelectric cooler transient method resistance voltage Seebeck voltage |
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