| IR FPA读出电路电注入测试系统 |
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| 引用本文： | 孟丽娅,袁祥辉,程瑶,吕果林,黄友恕.IR FPA读出电路电注入测试系统[J].电子器件,2007,30(3):915-917. |
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| 作者姓名： | 孟丽娅 袁祥辉 程瑶 吕果林 黄友恕 |
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| 作者单位： | 重庆大学光电技术及系统教育部重点实验室,重庆,400030 |
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| 摘 要： | 利用电流注入方式可以方便地模拟光电流注入,从而对红外焦平面阵列读出电路进行参数测试.采用NI公司的MIO-16E-1数据采集卡,通过软件编程,低成本、高效率地实现了读出电路的参数测试系统.使用多帧统计计算的方法对读出电路阵列的均方根噪声、动态范围和非均匀性等参数进行了测试.测试结果表明成品率达到64%以上,该批合格管芯已成功用于成像实验.
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| 关 键 词： | 红外技术 参数测试 虚拟仪器 读出电路 |
| 文章编号： | 1005-9490（2007）03-0915-03 |
| 修稿时间： | 2006-05-09 |
Current Injection Testing of the IR FPA Read-Out Circuit |
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| MENG Li-ya,YUAN Xiang-hui,CHENG-yao,LV Guo-lin,HUANG You-shu.Current Injection Testing of the IR FPA Read-Out Circuit[J].Journal of Electron Devices,2007,30(3):915-917. |
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| Authors: | MENG Li-ya YUAN Xiang-hui CHENG-yao LV Guo-lin HUANG You-shu |
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| Affiliation: | Key Laboratory of Optoelectronic Technology and Systems of the Education Ministry of China, Chongqing University, Chongqing 400030,China |
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| Abstract: | The parameter testing of readout circuit(ROIC) chip for infrared focal plane array(IR FPA) are carried out with current injected,instead of photocurrent input.Based on the MIO-16E-1 of National Instruments Corporation,this testing system is efficiently and economically implemented with software programming.The testing procedure uses the frames statistics computation method to calculate the dark noise,dynamic range and non-uniformity.The result shows that the yield is beyond 64%,and these dies have successfully worked in the imaging experiment. |
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| Keywords: | Infrared technology parameters testing virtual instruments readout circuit |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
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