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高反膜绝对反射率的精确测量
引用本文:李健,吴令安.高反膜绝对反射率的精确测量[J].光电子.激光,1995,6(6):359-361,390.
作者姓名:李健  吴令安
作者单位:山东师范大学物理系,中科院物理所
摘    要:利用光学谐振腔的透射谱特性,通过测量其透射光谱的极大、极小值,求出高反射率膜片的绝对反射率,测量误差为10^-4量级。

关 键 词:高反膜镜  反射率  测量  光学谐振腔

Accurate Measurement of Absolute Reflectivity of High Reflective Dielectric Films
Li Jian,Zhuo Zhuang,Wu Ling-An.Accurate Measurement of Absolute Reflectivity of High Reflective Dielectric Films[J].Journal of Optoelectronics·laser,1995,6(6):359-361,390.
Authors:Li Jian  Zhuo Zhuang  Wu Ling-An
Abstract:The absolute reflectivity of high reflective dielectric films were measured by the fineness of the resonator or the maximum and minimum of the transmission spectrum according to the property of the transmission spectroscopy of theresonator, and the measuring error was reduced as low as 10-4.
Keywords:optical resonator  transmission spectrum  fineness  
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