| 连续太赫兹成像系统对多层蜂窝样件无损检测的实验研究 |
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| 引用本文： | 杨振刚,刘劲松,王可嘉.连续太赫兹成像系统对多层蜂窝样件无损检测的实验研究[J].光电子．激光,2013(6):1158-1162. |
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| 作者姓名： | 杨振刚 刘劲松 王可嘉 |
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| 作者单位： | 华中科技大学 光学与电子信息学院 武汉光电国家实验室,湖北 武汉 430074;华中科技大学 光学与电子信息学院 武汉光电国家实验室,湖北 武汉 430074;华中科技大学 光学与电子信息学院 武汉光电国家实验室,湖北 武汉 430074 |
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| 基金项目： | 湖北省自然科学基金(2012FFA074)和校自主创新研究基金(2012QN094,2012QN097)资助项目 (华中科技大学 光学与电子信息学院武汉光电国家实验室,湖北 武汉 430074) |
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| 摘 要： | 太赫兹无损检测作为一种新型技术,已经成为X射 线和超声无损检测技术的有力补充。太赫兹连续波成像技术可以进行实时成像,其扫描速度 和成像质量都能满足太赫兹无损检测的要求。本文利用连续太赫兹成像系统对多层蜂窝样件 进行了检测,得到了样件不同纵深处的二维太赫兹图像。测试结果表明该系统能测试样件内 部每一层中夹杂异物的位置、分布情况及轮廓,并能对异物的基本属性做出判断。本研究为 太赫兹连续成像系统用于航空、航天、电子等样件的无损检测提供了有借鉴意义的案例。
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| 关 键 词： | 太赫兹(THz)成像 无损检测 THz科学与技术 反射式成像 |
| 收稿时间： | 2012/11/22 0:00:00 |
Experimental research on nondestructive inspection for multilayer cellular sampl es using continuous terahertz waves imaging system |
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| Affiliation: | School of Optical and Electronic Information,Wuhan National Laboratory for Opto electronics,Huazhong University of Science & Technology,Wuhan 430074,China;School of Optical and Electronic Information,Wuhan National Laboratory for Opto electronics,Huazhong University of Science & Technology,Wuhan 430074,China;School of Optical and Electronic Information,Wuhan National Laboratory for Opto electronics,Huazhong University of Science & Technology,Wuhan 430074,China |
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| Abstract: | Nondestructive inspection is an emerging technique which can be conduc ted directly in the testing ground with no damage to the parts or materials.Now it has been widely used in evaluating the quality of samples.Because of the ch aracteristics of low energy,high signal to noise ratio (SNR) of the time-domain spectroscopy,terahertz (THz) waves play an important role in nondestructiv e testing.Continuous terahertz waves imaging systems provide us a novel way for nondestructive inspection.Using such a system,a mu ltilayer cellular sample has been inspected and the two-dimensional terahertz i m ages in different layers of the sample are obtained.The results indicate that t he location,distribution,outlines and properties of the inclusions in the sample can be inspected by the system.Our research provides a reference case for cont inuous terahertz imaging systems used as nondestructive inspecting devices i n aviation,aerospace,electronics and other fields. |
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| Keywords: | : terahertz (THz) imaging nondestructive inspection THz science and technology reflection imaging |
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