首页 | 本学科首页   官方微博 | 高级检索  
     

正交法制作50μm/50μm精细线路工艺参数的优化
引用本文:何杰,何为,黄雨新,冯立,徐缓,周华,罗旭,戴冠军.正交法制作50μm/50μm精细线路工艺参数的优化[J].印制电路信息,2013(3):31-34,57.
作者姓名:何杰  何为  黄雨新  冯立  徐缓  周华  罗旭  戴冠军
作者单位:1. 电子科技大学,四川 成都 610054
2. 博敏电子股份有限公司,广东 梅州 514000
摘    要:在公司批量生产HDI板最小线宽/间距为75μm/75μm能力的基础上制作了线宽/间距为50μm/50μm的精细线路,试验用LDI曝光机曝光后再用正交试验法的L9(3^4)正交表安排了显影速度、蚀刻速度、显影压力、蚀刻压力四因素试验,选取线宽和蚀刻因子作为指标。通过对两个指标的综合分析,试验得到最佳工艺参数为:显影速度为4.0m/min,显影上压力为0.18MPa,下压力为0.15MPa,蚀刻速度为4.5m/min,蚀刻上压力为O.28MPa,下压力为0.25MPa。

关 键 词:精细线路  LDI曝光  优化试验法  最佳参数

Orthogonal optimization the technique parameters made by the 50 μm/50 μm fine line
HE Jie,HE Wei,HUANG Yu-xing,FENG Li,XU Huan,ZHOU Hua,LUO Xu,DAI Guan-jun.Orthogonal optimization the technique parameters made by the 50 μm/50 μm fine line[J].Printed Circuit Information,2013(3):31-34,57.
Authors:HE Jie  HE Wei  HUANG Yu-xing  FENG Li  XU Huan  ZHOU Hua  LUO Xu  DAI Guan-jun
Affiliation:HE Jie HE Wei HUANG Yu-xing FENG Li XU Huan ZHOU Hua LUO Xu DAI Guan-jun
Abstract:The minimum line width of HDI in company batch production is 75μm/75μm. Based on the capacity, the fine line with the width of 50μm/50μm was made. In the study Lg(3^4)orthogonal arrangement was used to take the orthogonal experiment and four factors included, etching speed, developing speed, etching pressure and developing pressure. Meanwhile, the line width and etching factor were chosen as experimental indexes. After comprehensive consideration of the two experimental indexes, the optimum technique parameters were obtained in the study, the rate of developing is 4.0m/min, the above and below pressure of the developing is 1.8MPa and 1.5MPa, respectively. The rate of etching is 4.5m/min, the above and below pressure of etching is 2.8MPa and 2.5MPa, respectively.
Keywords:Fine Line  LDI Exposure  Orthogonal Experiment  Optimum Parameters
本文献已被 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号