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PCB信号完整性测试技术研究
引用本文:刘丰,苏新虹,胡新星.PCB信号完整性测试技术研究[J].印制电路信息,2014(1):30-34,37.
作者姓名:刘丰  苏新虹  胡新星
作者单位:珠海方正印刷电路板发展有限公司,广东珠海519170
摘    要:随着电子产品和设备工作频率和速率的提高,PCB信号完整性研究是近年来炙手可热的技术点。如何测试PCB信号完整性才是最准确的争论一直没有停止且随着技术的发展愈加激烈。大体上,IBM、CISCO等大公司在信号测试方面各具特色,INTEL也逐渐形成了一套单独的测试方法。除此之外,对于大批量PcB生产中的插入损耗监控也是一大课题.本文将对PCB信号完整性测试技术的发展和现状做一个简要总结,对比各种测试方法的优劣。

关 键 词:插入损耗  信号测试  信号完整性

The development of PCB signal integrity test technology
LIU Feng,SU Xin-hong,HU Xin-xing.The development of PCB signal integrity test technology[J].Printed Circuit Information,2014(1):30-34,37.
Authors:LIU Feng  SU Xin-hong  HU Xin-xing
Affiliation:LIU Feng SU Xin-hong HU Xin-xing
Abstract:PCB signal integrity research has been a popular technology for a very long time. It never stopped the argument on how to measure SI as the best rnethod. Mainly there are important companies like IBM and CISCO who own their own spectacular measurement coupons and procedure, also INTEL had developed an effective method on testing insertion loss too. Besides, figuring out how to supervise insertion loss in volume manufhcture of PCB is still a long road. The article will give a brief summary on the developing and status of testing signal integrity, which would be compared to each other as well.
Keywords:Insertion Loss Measurement  High Speed Material  Signal Integrity
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