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高速A/D转换器单粒子效应实时评估系统和方法研究
引用本文:魏亚峰,温显超,郭刚,梅博,康成蓥,刘璐,伍江雄,陈超,俞宙,王健安,刘杰.高速A/D转换器单粒子效应实时评估系统和方法研究[J].微电子学,2023,53(6):1017-1022.
作者姓名:魏亚峰  温显超  郭刚  梅博  康成蓥  刘璐  伍江雄  陈超  俞宙  王健安  刘杰
作者单位:重庆吉芯科技有限公司, 重庆 400060;中国原子能科学研究院, 北京 102400;中国空间技术研究院, 北京 102400;中国科学院兰州近代物理研究所, 兰州 730000
摘    要:提出了一种在线实时检测评估高速A/D转换器(ADC)的单粒子效应的测试方法。基于该方法搭建了部分模块可复用的单粒子效应测试评估系统。系统由时钟生成模块、待测ADC模块、D/A转换器(DAC)转换输出模块、FPGA控制模块与上位机模块构成。对待测ADC模块进行重构,可完成对不同ADC器件的测试评估,提升了模块可复用性和测试效率。该系统通过监测电源引脚的电流变化、ADC内部寄存器值翻转情况、经过高速DAC转换输出的模拟波形,可实时测试评估ADC器件的单粒子锁定(SEL)、单粒子翻转(SEU)、单粒子瞬态(SET)、单粒子功能中断(SEFI)等效应。基于该系统对自主研发的具有JESD204B接口的12位2.6 GS/s高速ADC进行了单粒子效应试验。试验分析表明,该系统能准确高效评估高速ADC器件的单粒子效应。

关 键 词:测试系统    单粒子效应    模数转换器
收稿时间:2023/10/9 0:00:00

Research on Real-Time Evaluation System and Method of Single Event Effects of High-Speed ADC
Affiliation:Chongqing GigaChip Technology Co., Ltd., Chongqing 400060, P.R.China;China Institute of Atomic Energy, Beijing 102400, P.R.China;China Academy of Space Technology, Beijing 102400, P.R.China; Institute of Modern Physics, Chinese Academy of Science, Lanzhou 730000, P.R.China
Abstract:A test method for online real-time detection and evaluation of single event effects in high-speed ADC devices was proposed. Based this method, a single event effect test and evaluation system with some reusable modules was built. The system was composed of clock generation module, ADC module to be tested, DAC conversion output module, FPGA control module and host computer module. Reconstructing the ADC module to be tested could complete the test and evaluation of different devices, which improved the reusability and test efficiency of the module. By monitoring the current change of the power supply pin, the flipping of the ADC internal register values and the analog waveforms converted by the high-speed DAC output, the system could test and evaluate the single event lock (SEL), single event upset (SEU), single event transient (SET), single event function interruption (SEFI) and other effects of the ADC device in real time. Based on this system, the single event effect test of a self-developed 12 bit 2.6 GS/s high-speed ADC with JESD204B interface was carried out. The experimental analysis shows that the system can evaluate accurately and efficiently the single event effect of high-speed ADC devices.
Keywords:testing system  single event effect  analog-to-digital converter (ADC)
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