| 基于ATE的8位超高速ADC动态参数测试 |
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| 引用本文： | 冯耀莹,杨晓强.基于ATE的8位超高速ADC动态参数测试[J].微电子学,2015,45(3):413-416. |
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| 作者姓名： | 冯耀莹 杨晓强 |
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| 作者单位： | 中国电子科技集团公司 第二十四研究所, 重庆 400060,中国电子科技集团公司 第二十四研究所, 重庆 400060 |
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| 摘 要： | 提出了一种采用Advantest 93000型自动测试设备,配合外挂高性能信号源SMA 100A,对8位1.5 GS/s超高速ADC进行动态参数测试的方案。该方案使用外挂信号源,提供采样时钟和模拟输入信号,解决了93000与外部信号源之间输入信号不同步,以及两者频率差异导致的采样不稳定问题,有效提升了93000测试超高速ADC动态参数的能力,可广泛应用于超高速ADC量产测试。
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| 关 键 词： | ATE 超高速ADC 动态参数 同步采样 |
| 收稿时间： | 2014/7/11 0:00:00 |
Measurement of Dynamic Parameters for a 8 Bit High-Speed A/D Converter Based on ATE |
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| FENG Yaoying and YANG Xiaoqiang.Measurement of Dynamic Parameters for a 8 Bit High-Speed A/D Converter Based on ATE[J].Microelectronics,2015,45(3):413-416. |
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| Authors: | FENG Yaoying and YANG Xiaoqiang |
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| Affiliation: | Sichuan Institute of Solid-State Circuits, China Electronics Technology Group Corp., Chongqing 400060, P. R. China and Sichuan Institute of Solid-State Circuits, China Electronics Technology Group Corp., Chongqing 400060, P. R. China |
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| Abstract: | Based on Advantest 93000 ATE, an approach to test the dynamic parameters of 8-bit 1.5 GS/s ultra high speed A/D converter was presented in combination with the high performance external signal source SMA 100A. The problems of the unstable sampling caused by frequency difference and the asynchronization of the input signals from 93000 and external signal source was solved with external signal source providing a sampling clock and analog signals. It had improved the test performance of 93000 for testing the dynamic parameters of ultra high speed A/D converters. It can be widely applied in mass product test of ultra high speed A/D converters. |
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| Keywords: | ATE Ultra high speed A/D converter Dynamic parameter Synchronizing sampling |
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