|
|||||
|
|
| 分子束外延ZnS1－xTex单晶薄膜特性分析 | |
| 作者单位： | ：暨南大学, 广州 510632 |
| 摘 要： | The
modified Auger parameter (α′)of Zn and Te in ZnS1－xTex(0≤x≤1)
single－crystal alloy thin films grown by MBE is measured with high resolution.It is
shown that α′increases almost linearly with x and that the variations of α′Zn
are larger than those of α′Te.Furthermore,it is similar for the variation of
XPS peaks of Te 4d3/2 and Te 4d5/2 with x. |