| 光通信有源器件的可靠性试验 |
| |
| 引用本文： | 文继秀.光通信有源器件的可靠性试验[J].半导体光电,1991,12(1):6-11. |
| |
| 作者姓名： | 文继秀 |
| |
| 作者单位： | 重庆光电技术研究所 重庆永川632163 |
| |
| 摘 要： | 本文主要报导日本光纤通信用光发射和探测器件的可靠性试验。
|
| 关 键 词： | 有源器件 光通信 可靠性 试验 |
Tests on Reliability of Active Devices for Optical Communication |
| |
| Wen Jixiu Chongqing Optoelectronics Research Institute Yongchuan,Chongqing.Tests on Reliability of Active Devices for Optical Communication[J].Semiconductor Optoelectronics,1991,12(1):6-11. |
| |
| Authors: | Wen Jixiu Chongqing Optoelectronics Research Institute Yongchuan Chongqing |
| |
| Affiliation: | Wen Jixiu Chongqing Optoelectronics Research Institute Yongchuan,Chongqing 632163 |
| |
| Abstract: | The article reports mainly the tests on reliability of optic trans- mitters and detectors for fiber optic communications in Japan. |
| |
| Keywords: | Active Devices Optical Communication Reliability |
| 本文献已被 CNKI 维普 等数据库收录！ |
