| 基于LSM的红外LED加速寿命试验数据的统计分析 |
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| 引用本文： | 张建平.基于LSM的红外LED加速寿命试验数据的统计分析[J].半导体光电,2005,26(2):92-96. |
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| 作者姓名： | 张建平 |
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| 作者单位： | 浙江大学,信息与电子工程学系,浙江,杭州,310027;浙江京东方显示技术股份有限公司,浙江,绍兴,312000 |
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| 基金项目： | 浙江省博士后科研择优项目 |
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| 摘 要： | 利用最小二乘法(LSM)完成了红外发光二极管(LED)恒定与步进应力加速寿命试验数据的统计分析,并自行开发了可视界面和通用性强的寿命预测软件.数值结果证实了红外LED的寿命服从对数正态分布以及加速寿命方程完全符合逆幂定律,并精确地计算出预测该器件寿命所用到的关键性参数,从而使其在很短的时间(1000h)内估算寿命成为可能.
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| 关 键 词： | 发光二极管 加速寿命试验 LSM 对数正态分布 加速系数 平均寿命 |
| 文章编号： | 1001-5868(2005)02-0092-05 |
| 修稿时间： | 2004年11月24日 |
Statistic Analysis on Accelerated Life Test Data for Infrared LED Based on LSM |
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| ZHANG Jian-ping.Statistic Analysis on Accelerated Life Test Data for Infrared LED Based on LSM[J].Semiconductor Optoelectronics,2005,26(2):92-96. |
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| Authors: | ZHANG Jian-ping |
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| Abstract: | Statistic analysis on c on stant-stress and step-stress accelerated life test data for infrared LED is fi nished by using least square method (LSM),and the predicted-life software with strong visual interface and versatility is developed by ourselves.The numerical results verified that the infrared LED life submits to logarithmic normal distri bution and that the accelerated life equation meets completely the inverse power law.The key parameters used to predict the device life are accurately calculate d,which makes it possible that the life is estimated in a short time( (1000 h).) |
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| Keywords: | LED accelerated life test LSM logarithmic nor mal distribution accelerated factor mean life |
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