Electrical activity,mode of incorporation and distribution coefficient of group V elements in Hg1−xCdxTe grown from tellurium rich liquid phase epitxial growth solutions |
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Authors: | H R Vydyanath J A Ellsworth C M Devaney |
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Affiliation: | (1) Aerojet ElectroSystems Co., 1100 W. Hollyvale Street, P.O. Box 296, 91702 Azusa, California |
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Abstract: | Hg1−xCdxTe films were grown liquid phase epitaxially from tellurium rich solutions containing up to 10 at. % of the group V elements
P, As, Sb, and Bi. Chemical analysis of the Te growth solutions and the films was carried out in conjunction with extensive
Hall effect measurements on the films subsequent to various annealing treatments under Hg rich and Te rich conditions. Despite
the presence of a large concentration of the group V elements in the Te source solution, the maximum concentration of these
elements incorporated into the liquid phase epitaxially grown Hg1-xCdxTe appears to vary from <1015cm−3 for Bi up to 1017cm−3 for phosphorus and As implying a distribution coefficient varying from <10−5 for Bi up to 10−3 for P at growth temperature of ∼500° C. This low value of the distribution coefficient for group V elements for growths from
Te rich solutions contrasts with the moderately high values reported in the literature to date for growth from Hg rich solutions
as well as pseudobinary solutions (Bridgman growth). The widely differing distribution coefficients and hence the solubility
of the group V elements for Hg rich and Te rich liquid phase epitaxial solutions is explained on the basis that the activity
coefficient of the group V elements in Te rich solutions is probably orders of magnitude lower than it is in Hg rich solutions.
Finally, the results of the anneals at 200° C under Hg saturated conditions with and without a 500° C Hg saturated preanneal
have indicatedn top conversion in many of the films attesting to the amphoteric behavior of the group V elements in LPE grown Hg1−xCdxTe(s) similar to the previously reported behavior of P in bulk grown Hg0.8Cd0.2Te. |
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Keywords: | Hg1− xCdxTe LPE Doping Distribution Coefficient |
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