Comparative Study on the Properties of Galvanically Deposited Nano- and Microcrystalline Thin Films of PbSe |
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Authors: | Nillohit Mukherjee Anup Mondal |
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Affiliation: | (1) Department of Inorganic and Analytical Chemistry, Hebrew University of Jerusalem, Jerusalem, 91904, Israel;(2) Department of Chemistry, Solid State Institute, Technion, Haifa, 32000, Israel; |
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Abstract: | Thin films of PbSe having both nano- and microstructures have been deposited on transparent conducting oxide (TCO)-coated
glass substrates electrochemically, from an aqueous solution of Pb(OAc)2, ethylenediamine tetraacetic acid (EDTA), and SeO2. A Pb strip acted as the sacrificial anode, while the TCO glass was the cathode. No external bias was applied. The formation
of PbSe was pH sensitive, and pH ~3 was found to be optimum for film deposition. Films grown at room temperature (25°C) were
nanocrystalline (~25 nm), while those deposited at 80°C were microcrystalline (~150 nm). Films were characterized by x-ray
diffraction studies, field-emission scanning electron microscope image analysis, infrared spectral analysis, and by both alternating-current
(a.c.) and direct-current (d.c.) electrical measurements. A blue-shift was observed for the nanocrystalline films. Film resistivity
and junction properties were obtained from electrical measurements. |
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