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无铅再流焊接BGA球窝缺陷研究
引用本文:孙磊,刘哲,樊融融.无铅再流焊接BGA球窝缺陷研究[J].电子工艺技术,2009,30(3).
作者姓名:孙磊  刘哲  樊融融
作者单位:中兴通讯,广东,深圳,518057
摘    要:球窝现象是密间距BGA、CSP类器件在无铅再流焊接中经常发生的一种高发性缺陷.在现场案例解剖、分析获取的数据和分析资料的基础上,根据其所表现的物理特征对球窝现象进行了分类.并基于密间距PBGA、CSP在再流焊接过程中所发生的物化现象,对其形成机理进行了研究和试验,在此基础上初步探讨了抑制此现象的对策.

关 键 词:球窝

Study on Pillow Effect in Lead-Free Reflow Process
SUN Lei,LIU Zhe,FAN Rong-rong.Study on Pillow Effect in Lead-Free Reflow Process[J].Electronics Process Technology,2009,30(3).
Authors:SUN Lei  LIU Zhe  FAN Rong-rong
Affiliation:ZTE Corporation;Shenzhen 518057;China
Abstract:Pillow-head effect is often discovered on fine pitch BGA/CSP in lead-free assembly process.Classify the effect based on physical character,study and experiment to find the cause of the formation of pillow-head effect,advise how to restrain the effect.All of these is based on the physical and chemical phenomena of fine pitch BGA/CSP assembly.
Keywords:BGA  CSP
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