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射频磁控溅射法制备掺锆氧化锌透明导电薄膜
引用本文:刘汉法,张化福,类成新,袁长坤.射频磁控溅射法制备掺锆氧化锌透明导电薄膜[J].电子元件与材料,2008,27(11).
作者姓名:刘汉法  张化福  类成新  袁长坤
作者单位:山东理工大学,物理与光电信息技术学院,山东,淄博,255049
基金项目:山东理工大学创新团队支持计划
摘    要:利用射频磁控溅射法在室温下制备出了掺锆氧化锌(ZnO∶Zr)透明导电薄膜。研究了溅射压强对ZnO∶Zr薄膜表面形貌、结构、光学和电学性能的影响。结果表明:ZnO∶Zr薄膜为六角纤锌矿结构的多晶薄膜,且具有c轴择优取向,溅射压强对薄膜电阻率有显著影响,压强为1.5Pa时,电阻率具有最小值1.77×10–3Ω·cm。所制备的ZnO∶Zr薄膜具有良好的附着性能,在可见光区平均透过率超过93%。

关 键 词:电子技术  ZnO∶Zr薄膜  透明导电薄膜  磁控溅射

Preparation of transparent conducting zirconium-doped zinc oxide thin films deposited by RF magnetron sputtering
LIU Han-fa,ZHANG Hua-fu,LEI Cheng-xin,YUAN Chang-kun.Preparation of transparent conducting zirconium-doped zinc oxide thin films deposited by RF magnetron sputtering[J].Electronic Components & Materials,2008,27(11).
Authors:LIU Han-fa  ZHANG Hua-fu  LEI Cheng-xin  YUAN Chang-kun
Affiliation:LIU Han-fa,ZHANG Hua-fu,LEI Cheng-xin,YUAN Chang-kun ( School of Physics , Optic-Electronic Information,University of Technology of Sh,ong,Zi bo 255049,Sh,ong Province,China)
Abstract:Transparent conducting zirconium-doped zinc oxide thin films were prepared by radio frequency magnetron sputtering at room temperature. The influence of sputtering pressure on surface morphology, micro-structure, optical and electrical properties of ZnO∶ Zr thin films were investigated. The results show that all the films are polycrystalline with a hexagonal structure and a preferred orientation along the c-axis. Sputtering pressure plays an important role on the electrical resistivity of ZnO ∶ Zr thin films. When the sputtering pressure is 1.5 Pa, it is obtained that the lowest electrical resistivity is 1.77×10–3 Ω·cm. All the films possess good adhesion and the average transmittance of over 93% in the visible range.
Keywords:electron technology  zirconium-doped zinc oxide thin films  transparent conducting films  magnetron sputtering  
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