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衬底温度和溅射偏压对ZnO:Al透明导电膜结构和光电特性的影响
引用本文:杨田林,韩圣浩,张鹏,王爱芳.衬底温度和溅射偏压对ZnO:Al透明导电膜结构和光电特性的影响[J].电子元件与材料,2004,23(7):31-34.
作者姓名:杨田林  韩圣浩  张鹏  王爱芳
作者单位:山东大学威海分校应用物理系,山东,威海,264209
基金项目:国家自然科学基金资助项目(60176021)
摘    要:利用射频磁控溅射法在有机薄膜衬底和7059玻璃衬底上制备出了具有良好附着性的低电阻率的 ZnO:Al透明导电膜。研究了薄膜的结构和光电特性与衬底温度的关系,薄膜为多晶纤锌矿结构,垂直于衬底的 c 轴具有002]方向的择优取向,薄膜的最低电阻率分别为 1.01×10–3ù·cm 和 8.48×10–4ù·cm,在可见光区的平均透过率分别达到了72%和 85%。并研究了溅射偏压对有机衬底 ZnO:Al 薄膜结构及光电特性影响,最佳负偏压为 60 V。

关 键 词:ZnO:Al薄膜  衬底温度  溅射偏压  膜结构  光电性质
文章编号:1001-2028(2004)07-0031-04

Effects of Substrate Temperature and Sputtering Bias-voltage on ZnO:Al Film Structure and Photoelectric Properties
YANG Tian-lin,HAN Sheng-hao,ZHANG Peng,WANG Ai-fang.Effects of Substrate Temperature and Sputtering Bias-voltage on ZnO:Al Film Structure and Photoelectric Properties[J].Electronic Components & Materials,2004,23(7):31-34.
Authors:YANG Tian-lin  HAN Sheng-hao  ZHANG Peng  WANG Ai-fang
Abstract:Transparent conductive ZnO:Al films with good adherence and low resistivity were deposited on polyimide or 7059 glass substrates by RF magnetron. Of the film prepared, the resistivity is as low as 1.01×10-3 ù·cm and 8.48×10-4ù·cm, and transmittance 72% and 85% in visible range. XRD pattern shows that ZnO:Al film deposited on above-mentioned substrates is polycrystalline wurtzite structure with a preferred orientation of 222]. The effects of substrate temperature and sputtering bias-voltage on film structure and photoelectric properties are investigated. The optimum sputtering bias-voltage is 60 V.
Keywords:Al doped ZnO films  substrate temperature  sputtering bias-voltage  film structure  photoelectric properties
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