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掺杂浓度对AZO薄膜结构和性能的影响
引用本文:葛春桥,夏志林,郭爱云.掺杂浓度对AZO薄膜结构和性能的影响[J].电子元件与材料,2004,23(9):31-33.
作者姓名:葛春桥  夏志林  郭爱云
作者单位:武汉理工大学材料科学与工程学院,湖北,武汉,430070;武汉理工大学材料科学与工程学院,湖北,武汉,430070;武汉理工大学材料科学与工程学院,湖北,武汉,430070
摘    要:采用溶胶–凝胶工艺在玻璃基片上制备出Al3+掺杂型的ZnO(AZO)透明导电薄膜,对薄膜进行了XRD和SEM分析,并对其光电性能作了详细的研究。结果表明薄膜为纤锌矿型结构,呈c轴方向择优生长;薄膜的可见光透过率可达80%以上;Al3+掺杂型的ZnO透明导电薄膜的电阻率为1.5×10–2~8.2×10–2?·cm。

关 键 词:半导体材料  AZO薄膜  溶胶-凝胶  光电性能
文章编号:1001-2028(2004)09-0031-03

Influence of the Dopant Concentration on Its Microstructure and Properties of AZO Film
GE Chun-qiao,XIA Zhi-lin,GUO Ai-yun.Influence of the Dopant Concentration on Its Microstructure and Properties of AZO Film[J].Electronic Components & Materials,2004,23(9):31-33.
Authors:GE Chun-qiao  XIA Zhi-lin  GUO Ai-yun
Abstract:AZO(Al:ZnO) films on glass substrate were prepared by sol-gel method. Their microstructures, electrical and optical properties were studied with X-ray diffraction spectroscopy (XRD) and SEM. The results show that they have a polycrystalline hexagonal wurtzite structure with highly preferred orientation along the (002) plane, their optical transmittance are over 80% and their electrical resistivity varied from1 5×10–2 to 8.2×10–2 ?·cm.
Keywords:semiconductor materials  oploeleclronics and laser technology  AZO thin film  sol-gel  electrical and optical properties
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